Dr. Gene E. Parris
at Air Products and Chemicals Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 March 2007 Paper
Minoru Sugiyama, Masakazu Sanada, Suping Wang, Patrick Wong, Stephan Sinkwitz, Manuel Jaramillo, Gene Parris
Proceedings Volume 6519, 651927 (2007) https://doi.org/10.1117/12.712188
KEYWORDS: Line width roughness, Electroluminescence, Semiconducting wafers, Lithography, Immersion lithography, Finite element methods, Photoresist processing, Scanners, Scanning electron microscopy, Optical lithography

Proceedings Article | 12 May 2005 Paper
Bridgette Budhlall, Gene Parris, Peng Zhang, Xiaoping Gao, Zarka Zarkov, Brenda Ross, Simon Kaplan, John Burnett
Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.600025
KEYWORDS: Refractive index, Absorbance, Water, Photoresist materials, Immersion lithography, Absorption, Microfluidics, Ultraviolet radiation, Semiconducting wafers, Fluid dynamics

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