Jennifer Marie Rossler
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 June 2004 Paper
David Kisker, Leo Chirovsky, Ryan Naone, James Van Hove, Jennifer Rossler, Martin Adamcyk, N. Wasinger, James Beltran, David Galt
Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.539285
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Temperature metrology, Process control, Reliability, Eye, Statistical analysis, Resistance, Control systems, Manufacturing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top