Junsik Hong
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Poster
Jihye Kim, Hojin Kang, Yongsun Cho, Junsik Hong, Heeyeop Chae
Proceedings Volume 12958, 129580S (2024) https://doi.org/10.1117/12.3014577
KEYWORDS: Atomic layer etching, Silica, Plasma, Plasma etching, Etching, Climate change, X-ray photoelectron spectroscopy, Windows, Plasma generation, Ions

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