Laurynas Čekanavičius
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 24 May 2018 Paper
Proceedings Volume 10677, 106772K (2018) https://doi.org/10.1117/12.2307595
KEYWORDS: Optical damage, Photopolymers, Inspection, Scanning electron microscopy, Standards development, Laser damage threshold, Femtosecond phenomena, Refractive index, Laser induced damage, Chemical elements

Proceedings Article | 22 February 2018 Presentation + Paper
Proceedings Volume 10544, 1054417 (2018) https://doi.org/10.1117/12.2290155
KEYWORDS: Optical components, Femtosecond phenomena, Scanning electron microscopy, Nanolithography, Lithography, Polymers, Optical damage, Laser damage threshold, 3D microstructuring, Laser induced damage

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