Dr. Peter Moeck Profile

Dr. Peter Moeck

Assistant Professor at Portland State Univ

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Author

Publications (8)

Proceedings Article | 31 October 2006 Paper

Image-based nanocrystallography with online database support

Peter Moeck, Ján Zahornadský, Boris Dušek, Philip Fraundorf

Proceedings Volume 6370, 63701A (2006) https://doi.org/10.1117/12.676656

KEYWORDS: Crystals, Optical spheres, Nanocrystals, Visibility, Databases, Crystallography, Diffraction, Transmission electron microscopy, Microscopes, Image resolution

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Proceedings Article | 24 November 2005 Paper

Epitaxial and endotaxial semiconductor quantum dots: atomic order, morphological transformations, and structural transitions

Peter Moeck

Proceedings Volume 6002, 60020F (2005) https://doi.org/10.1117/12.634870

KEYWORDS: Silicon, Quantum dots, Tin, Semiconductors, Transmission electron microscopy, Chemical species, Thermodynamics, Compound semiconductors, Interfaces, Gallium

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Proceedings Article | 7 November 2005 Paper

Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases

Peter Moeck, Ondřej Čertik, Bjoern Seipel, Rebecca Groebner, Lori Noice, Girish Upreti, Philip Fraundorf, Rolf Erni, Nigel Browning, Andreas Kiesow, Jean-Pierre Jolivet

Proceedings Volume 6000, 60000M (2005) https://doi.org/10.1117/12.629818

KEYWORDS: Nanocrystals, Crystals, Databases, Crystallography, Transmission electron microscopy, Image resolution, X-ray diffraction, Microscopes, X-rays, Spatial frequencies

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Proceedings Article | 7 November 2005 Paper

Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usage

Peter Moeck

Proceedings Volume 6000, 60000Q (2005) https://doi.org/10.1117/12.629785

KEYWORDS: Calibration, Scanning probe microscopes, Semiconducting wafers, Crystals, Silicon, Heteroepitaxy, Scanning tunneling microscopy, Molecular beam epitaxy, Superlattices, Spinel

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Proceedings Article | 15 November 2002 Paper

Structural transformations in self-assembled semiconductor quantum dots as inferred by transmission electron microscopy

Peter Mock, Yuanyuan Lei, Teya Topuria, Nigel Browning, Regina Ragan, Kyu Min, Harry Atwater

Proceedings Volume 4807, (2002) https://doi.org/10.1117/12.450998

KEYWORDS: Silicon, Tin, Transmission electron microscopy, Quantum dots, Scanning transmission electron microscopy, Semiconductors, Diffraction, Image resolution, Modulation, Interfaces

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Proceedings Article | 14 April 1999 Paper

Optical studies of InAs/In(As,Sb) single quantum well (SQW) and strained-layer superlattice (SLS) LEDs for the mid-infrared (MIR) region

Harvey Hardaway, Joerg Heber, Peter Moeck, Mark Pullin, Tony Stradling, Patrick Tang, Christopher Phillips

Proceedings Volume 3621, (1999) https://doi.org/10.1117/12.344470

KEYWORDS: Light emitting diodes, Laser sintering, Quantum wells, Luminescence, Indium arsenide, Superlattices, Antimony, Electroluminescence, Absorption, Semiconducting wafers

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Proceedings Article | 11 December 1998 Paper

X-ray optics of in-situ synchrotron topography studies of the early stages of relaxation in epitaxial InGaAs on GaAs

Brian Tanner, Andrew Keir, Peter Moeck, Colin Whitehouse, Gareth Lacey, Andrew Johnson, Gilbert Smith, Graham Clark

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332496

KEYWORDS: Reflection, Crystals, Silicon, Laser crystals, Gallium arsenide, Phase contrast, Indium gallium arsenide, Diffraction, Synchrotron radiation, Distortion

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Proceedings Article | 7 April 1998 Paper

Recent advances in In(As,Sb) SLS and QW LEDs for the 3- to 10-um region

Christopher Phillips, Harvey Hardaway, Joerg Heber, Peter Moeck, Mark Pullin, Patrick Tang, Peter Yuen

Proceedings Volume 3279, (1998) https://doi.org/10.1117/12.304425

KEYWORDS: Laser sintering, Light emitting diodes, Luminescence, Indium arsenide, Diodes, Quantum wells, Heterojunctions, Antimony, Absorption, Black bodies

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Showing 5 of 8 publications

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