Dr. Robert E. Mallard Profile

Dr. Robert E. Mallard

SPIE Involvement:

Conference Program Committee | Author

Publications (6)

Proceedings Article | 22 January 2005 Paper

Reliability of a thermally actuated MEMS VOA for optical component applications

Ryan Hickey, Robert Mallard, James Wylde, Thomas Shepperd, John Panton

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.590835

KEYWORDS: Signal attenuation, Resistance, Microelectromechanical systems, Actuators, Reliability, Monte Carlo methods, Instrument modeling, Optical components, Receivers, Attenuators

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Proceedings Article | 20 December 2004 Paper

Low-frequency noise, reliability, and quality of high-speed avalanche breakdown detectors

Saulius Smetona, Jonas Matukas, Vilius Palenskis, M. Olechnovicius, Kazys A. Kaminskas, Robert Mallard

Proceedings Volume 5577, (2004) https://doi.org/10.1117/12.567498

KEYWORDS: Avalanche photodiodes, Photodiodes, Avalanche photodetectors, Reliability, Halogens, Lamps, Absorption, Ionization, Electrons, Semiconductor lasers

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Proceedings Article | 25 March 2004 Paper

Reliability and intrinsic response of directly modulated MQW BH lasers

John Simmons, Ricardas Sobiestianskas, Robert Mallard, Gregory Letal

Proceedings Volume 5277, (2004) https://doi.org/10.1117/12.530606

KEYWORDS: Semiconductor lasers, Modulation, Reliability, Interfaces, Refractive index, Heterojunctions, Modes of laser operation, Quantum wells, Laser cutting, Laser damage threshold

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Proceedings Article | 8 August 2003 Paper

Low-frequency noise and quality prediction of MQW buried-heterostructure DFB lasers

Sandra Pralgauskaite, J. Matukas, V. Palenskis, G. Letal, R. Mallard, S. Smetona

Proceedings Volume 5123, (2003) https://doi.org/10.1117/12.517008

KEYWORDS: Semiconductor lasers, Laser damage threshold, Reliability, Interfaces, Quantum wells, Signal to noise ratio, Chlorine, Semiconducting wafers, Interference (communication), Diodes

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Proceedings Article | 16 January 2003 Paper

Reliability and qualification of an integrated MEMS attenuator for optical component applications

Ryan Hickey, Heiko Fettig, James Wylde, Stephane Legros, Robert Mallard, Heinz Nentwich, Christopher Hart

Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.472728

KEYWORDS: Microelectromechanical systems, Actuators, Reliability, Failure analysis, Resistance, Oxides, Signal attenuation, Attenuators, Optical components, Instrument modeling

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Proceedings Article | 1 May 1997 Paper

EBIC and TEM analysis of catastrophic optical damage in high-power GaAlAs/GaInAs lasers

Robert Mallard, Rick Clayton

Proceedings Volume 3004, (1997) https://doi.org/10.1117/12.273827

KEYWORDS: Transmission electron microscopy, Laser resonators, Pulsed laser operation, Failure analysis, Optical damage, High power lasers, Ions, Semiconductor lasers, Laser development, Photomicroscopy

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Showing 5 of 6 publications

Conference Committee Involvement (3)

Integrated Photonics Platforms III

7 April 2024 | Strasbourg, France

Integrated Photonics Platforms II

4 April 2022 | Strasbourg, France

Integrated Photonics Platforms: Fundamental Research, Manufacturing and Applications

6 April 2020 | Online Only, France

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