Tieshi Wei
at Suzhou Institute of Nano-Tech and Nano-Bionics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 November 2021 Paper
Proceedings Volume 12057, 1205708 (2021) https://doi.org/10.1117/12.2603864
KEYWORDS: Indium gallium arsenide, Silicon, Atomic force microscopy, Transmission electron microscopy, Interfaces, Epitaxy, Morphological analysis

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