Dr. Kenneth W. Tobin
Chief Research and University Partnerships Officer at Oak Ridge Associated Univs
SPIE Involvement:
Author
Area of Expertise:
Computer vision , Instrumentation , Pattern recognition , Metrology , Radiography , Image processing
Websites:
Profile Summary

Dr. Kenneth W. Tobin is the Chief Research and University Partnerships Officer at Oak Ridge Associated Universities (ORAU). In this role he grows ORAU’s research enterprise while expanding partnerships with the over 150 universities that are part of the ORAU consortium, by fostering relationships and business development opportunities with the federal government, national laboratories, and private industry. He also serves as the Institutional Official for ORAU, ensuring an effective human research protection program.

Prior to this he served in numerous research leadership positions at the Oak Ridge National Laboratory (ORNL) including Director of the Office of Institutional Planning, Director of the Reactor and Nuclear Systems Division, and Director of the Electrical and Electronics Systems Research Division. Dr. Tobin earned his BS in Physics and MS in Nuclear Engineering from Virginia Tech and his PhD in Nuclear Engineering from the University of Virginia, where his dissertation contribution was in computational imaging methods for neutron radiography. He has authored and coauthored more than 180 total publications and he holds 15 issued US patents that have been licensed by more than 20 semiconductor device manufacturers as well as patents licensed for use in the field of telemedicine. He is the recipient of numerous awards for his work including the American Telemedical Association Innovation Award, Battelle Memorial Institute Distinguished Inventor, two R&D 100 Awards, nine Federal Laboratory Consortium Awards, and the Tennessee Academy of Science Industrial Scientist of the Year. He was an ORNL Corporate Research Fellow, and is a Fellow of IEEE, SPIE, NAI and is a member of AAAS.
Publications (52)

Proceedings Article | 7 February 2011 Paper
Proceedings Volume 7877, 78770M (2011) https://doi.org/10.1117/12.876812
KEYWORDS: Imaging systems, Modulation transfer functions, Sensors, Radiography, Image resolution, Coded aperture imaging, Coded apertures, Scintillators, Charge-coupled devices, Optical simulations

Proceedings Article | 13 March 2010 Paper
Luca Giancardo, Fabrice Mériaudeau, Thomas Karnowski, Kenneth Tobin, Yaqin Li, Edward Chaum
Proceedings Volume 7623, 76230U (2010) https://doi.org/10.1117/12.844442
KEYWORDS: Radon, Radon transform, Detection and tracking algorithms, Image segmentation, Eye, Retina, Cameras, Sensors, Capillaries, Image processing

Proceedings Article | 3 April 2008 Paper
Proceedings Volume 6913, 69130D (2008) https://doi.org/10.1117/12.772825
KEYWORDS: 3D modeling, Skin, Monte Carlo methods, Absorption, Veins, Tissues, Scattering, 3D image processing, Photon transport, Blood

Proceedings Article | 29 May 2007 Paper
Proceedings Volume 6356, 63560G (2007) https://doi.org/10.1117/12.736740
KEYWORDS: Inspection, Microelectromechanical systems, Wavefronts, Interferometry, Photomasks, Semiconductors, Metrology, Semiconducting wafers, Holograms, Phase measurement

Proceedings Article | 21 March 2007 Paper
Proceedings Volume 6509, 65090H (2007) https://doi.org/10.1117/12.712576
KEYWORDS: Veins, Near infrared, Skin, Reflectivity, Cameras, Light emitting diodes, Principal component analysis, 3D modeling, Imaging systems, Calibration

Showing 5 of 52 publications
Proceedings Volume Editor (9)

SPIE Conference Volume | 10 March 2006

SPIE Conference Volume | 17 May 2005

SPIE Conference Volume | 29 April 2004

Showing 5 of 9 publications
Conference Committee Involvement (24)
Wavelet Applications in Industrial Processing VII
18 January 2010 | San Jose, California, United States
Image Processing: Machine Vision Applications II
22 January 2009 | San Jose, California, United States
Wavelet Applications in Industrial Processing VI
21 January 2009 | San Jose, California, United States
Image Processing: Machine Vision Applications
29 January 2008 | San Jose, California, United States
Wavelet Applications in Industrial Processing V
11 September 2007 | Boston, MA, United States
Showing 5 of 24 Conference Committees
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