Dr. Saeed R. Bagheri
Senior Research Staff Member at Philips Research North America
SPIE Involvement:
Author | Instructor
Publications (13)

Proceedings Article | 15 May 2012 Paper
Zahra Kavehvash, Khashayar Mehrany, Saeed Bagheri, Genaro Saavedra, Hector Navarro, Manuel Martinez-Corral
Proceedings Volume 8384, 838417 (2012) https://doi.org/10.1117/12.920977
KEYWORDS: 3D image processing, Image resolution, Integral imaging, Imaging systems, Microlens array, Spatial resolution, Photography, Microlens, Computational imaging, Sensors

Proceedings Article | 20 May 2011 Paper
Proceedings Volume 8043, 80430F (2011) https://doi.org/10.1117/12.886569
KEYWORDS: Image resolution, 3D image processing, Integral imaging, Frequency division multiplexing, Quantization, 3D displays, Numerical analysis, Imaging systems, 3D image reconstruction, Spatial frequencies

Proceedings Article | 5 April 2011 Paper
K. Lai, M. Gabrani, D. Demaris, N. Casati, A. Torres, S. Sarkar, P. Strenski, S. Bagheri, D. Scarpazza, A. Rosenbluth, D. Melville, A. Wächter, J. Lee, V. Austel, M. Szeto-Millstone, K. Tian, F. Barahona, T. Inoue, M. Sakamoto
Proceedings Volume 7973, 797308 (2011) https://doi.org/10.1117/12.879787
KEYWORDS: Source mask optimization, Photomasks, Lithography, Standards development, Algorithm development, Resolution enhancement technologies, Diffraction, Visualization, Photovoltaics

Proceedings Article | 5 May 2010 Paper
Proceedings Volume 7690, 76900O (2010) https://doi.org/10.1117/12.850552
KEYWORDS: Spatial frequencies, Image filtering, Principal component analysis, Modulation transfer functions, Amplitude modulation, Imaging systems, Signal to noise ratio, Phase modulation, 3D image processing, Modulation

Proceedings Article | 16 March 2010 Paper
David Melville, Alan Rosenbluth, Kehan Tian, Kafai Lai, Saeed Bagheri, Jaione Tirapu-Azpiroz, Jason Meiring, Scott Halle, Greg McIntyre, Tom Faure, Daniel Corliss, Azalia Krasnoperova, Lei Zhuang, Phil Strenski, Andreas Waechter, Laszlo Ladanyi, Francisco Barahona, Daniele Scarpazza, Jon Lee, Tadanobu Inoue, Masaharu Sakamoto, Hidemasa Muta, Alfred Wagner, Geoffrey Burr, Young Kim, Emily Gallagher, Mike Hibbs, Alexander Tritchkov, Yuri Granik, Moutaz Fakhry, Kostas Adam, Gabriel Berger, Michael Lam, Aasutosh Dave, Nick Cobb
Proceedings Volume 7640, 764006 (2010) https://doi.org/10.1117/12.846716
KEYWORDS: Source mask optimization, Photomasks, Metals, Lithography, Optical proximity correction, Line edge roughness, Resolution enhancement technologies, Diffractive optical elements, Semiconducting wafers, Scanning electron microscopy

Showing 5 of 13 publications
Conference Committee Involvement (4)
Three-Dimensional Imaging, Visualization, and Display 2012
24 April 2012 | Baltimore, Maryland, United States
Three-Dimensional Imaging, Visualization, and Display 2011
27 April 2011 | Orlando, Florida, United States
Three-Dimensional Imaging, Visualization, and Display 2010
7 April 2010 | Orlando, Florida, United States
Three-Dimensional Imaging, Visualization, and Display 2009
15 April 2009 | Orlando, Florida, United States
Course Instructor
SC946: Super Resolution in Imaging Systems
This course provides an introduction to the signal processing methods used to increase image resolution. Specifically, it provides attendees with the practical knowledge to estimate the benefits of using super resolution in an imaging system as well as the guidance to select the right super resolution method for a given application. The course is divided into three parts. In the first part, we describe the fundamental limits to resolution in an imaging system and establish the necessity of using signal processing as a mean to achieve super resolution. In the second part we focus on different super resolution techniques. Specifically, we cover defocus based techniques, zoom based techniques, photometry based techniques and edge enhancement based techniques. In the third part of the course we provide some real life examples from various imaging fields to establish how the super resolution techniques work. The attendee will therefore benefit from a concise and realistic overview of current signal processing methods for super resolution, and thus be able to make the right decision when it comes to accessing the potential use of super resolution for a specific product development.
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top