Prof. Yukitoshi Otani
Director, Ctr. for Optical Research & Education at Utsunomiya Univ
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Area of Expertise:
Optomechatoronics , polarimetry , optical measurement , polarization engineering , optical actuator and manipulator
Publications (128)

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 132410T (2024) https://doi.org/10.1117/12.3038696
KEYWORDS: Polarization, Fisheye lenses, Modulation transfer functions, Image quality, Image resolution, Distortion, Chromatic aberrations

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume 12909, 129090M (2024) https://doi.org/10.1117/12.3008856
KEYWORDS: Polarization, Cameras, Imaging systems, RGB color model, Wave plates, Industrial applications, Image analysis, Polarization analysis, Microscopes, Interferometry

Proceedings Article | 4 March 2024 Paper
Proceedings Volume 13070, 130701E (2024) https://doi.org/10.1117/12.3021809

Proceedings Article | 5 October 2023 Presentation
Proceedings Volume PC12690, PC126900B (2023) https://doi.org/10.1117/12.2681429
KEYWORDS: Cameras, RGB color model, Polarization, Imaging systems, Wave plates, Video, Microscopes, Interferometry, Imaging arrays, Calibration

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12690, 1269007 (2023) https://doi.org/10.1117/12.2677214
KEYWORDS: Polarization, Wave plates, Visualization, Polarized light, Superposition, Phase shifts, Wave propagation

Showing 5 of 128 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 17 November 2008

SPIE Conference Volume | 8 October 2007

SPIE Conference Volume | 12 October 2006

Conference Committee Involvement (66)
Polarization Science and Remote Sensing XII
3 August 2025 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XIV
23 June 2025 | Munich, Germany
Biomedical Imaging and Sensing Conference
21 April 2025 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Showing 5 of 66 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top